Artificial Intelligence & Information Analysis

2014

  1. N.Arvanitopoulos, D.Bouzas and A.Tefas, "Laplacian Support Vector Analysis for Subspace Discriminative Learning", International Conference on Pattern Recognition (ICPR), 2014.

2011

  1. D.Bouzas, N.Arvanitopoulos and A.Tefas, "Optimizing Linear Discriminant Error Correcting Output Codes Using Particle Swarm Optimization", 21st Int. Conf. on Artificial Neural Networks, June, 2011.

2010

  1. N.Arvanitopoulos, D.Bouzas and A.Tefas, "Mutual Information Measures for Subclass Error-Correcting Output Codes Classification", 6th Hellenic Conference on Artificial Intelligence, May 4 - 7, 2010.
  2. N.Arvanitopoulos, D.Bouzas and A.Tefas, "Subclass Error Correcting Output Codes using Fisher's Linear Discriminant Ratio", 20th International Conference on Pattern Recognition, September 15 - 18, 2010.
  3. D.Bouzas, N.Arvanitopoulos and A.Tefas, "Optimizing subclass discriminant Error Correcting Output Codes using particle swarm optimization", IEEE International Joint Conference on Neural Networks (IJCNN), July 18-23, 2010.

The documents contained in these directories are included by the contributing authors as a means to ensure timely dissemination of scholarly and technical work on a non-commercial basis. Copyright and all rights therein are maintained by the authors and by other copyright holders, notwithstanding that they have offered their works here electronically. It is only allowed to copy this information if you adhere to the terms and constraints invoked by each author's copyright. These works may not be reposted without the explicit permission of the copyright holder.

Some of the articles in this web site are copyrighted by IEEE and the following notice applies: © 1980-2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

";